MuLS
Oblique incidence of plane waves on dielectric multilayer stacks
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--- Preparing scripts ... ---
Vacuum wavelength:
µm
Angle of incidence:
°
Polarization:
s (TE)
p (TM)
Number of interior layers:
1
Clear
Fill
Solve
Scan
---
Grid
Geometry
Export
E
x
E
y
E
z
H
x
H
y
H
z
|
E
|
|
H
|
S
z
w
Interval:
x
∈ [
,
] µm
F
|
F
|
|
F
|
2
Plot
+
-
SVG
Detach
Select a number of interior layers, and enter the
properties of the dielectric multilayer stack
.
Solve
invokes the solver, displays the
transmittance properties
, and opens further dialogs for field
inspection
and for exporting data and figures. Choose
scan
to explore transmittance and reflectance
spectra
.
@
►
x:
µm
↵
angle of incidence
Grid
θ
I
∈
[
,
]
°
#
R
T
R & T
Re ρ, Im ρ
arg(ρ)
Re τ, Im τ
arg(τ)
Plot
+
-
SVG
Detach
Export
@
:
↵
Accept
Contact